The new models of the thicknessGAUGE sensor systems now offer higher performance for the inline thickness measurement of strip materials and sheets. The turnkey systems are now equipped with the latest laser sensors, laser scanners or confocal…

The performance of the scanCONTROL 3000 scanners has been increased: improved algorithms and components accelerate data acquisition and output to up to 10 million measuring points per second. The profile cal-culation and evaluation speed of the SMART…

The modular capaNCDT 62xx multi-channel system is one of the most modern capacitive systems and stands for modularity, interfaces and precision. The controller is now also available with the PROFINET Industrial Ethernet interface. This enables…

The IMS5420-TH white light interferometer opens up new perspectives in industrial thickness measurement of monocrystalline silicon wafers. Due to its broadband superluminescent diode (SLED), the IMS5420-TH can be used for undoped, doped and highly…