Measurement of the diameter of profiles

Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system.

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optoCONTROL 2520

HEADQUARTER MICRO-EPSILON AMERICA
8120 Brownleigh Dr.
Raleigh, NC 27617
me-usa@micro-epsilon.com
919 787 9707
919 787 9706