Thickness measurement systems for complex applications

The IPC-based measurement systems of the thicknessCONTROL 820x series are equipped with powerful signal processing software. The systems are largely based on discrete laser line technology and so are suitable for complex applications. The systems are available in C-frame or O-frame-configurations. Accessories for harsh environments such as pneumatic protection devices for lenses, cooling packages for switching cabinets and sensor technology complete the product range.

Special features:

  •     Large range of different measuring ranges
  •     Stable measurement frame made from aluminum
  •     Proven protection and cleaning concepts for harsh ambient conditions
  •     Multi-touch capability, gesture-controlled analysis and control software
  •     Measurement of profile characteristics (with LLT sensor technology)
  •     Patented compensation of parasitic, thermal effects

HEADQUARTER MICRO-EPSILON AMERICA
8120 Brownleigh Dr.
Raleigh, NC 27617
me-usa@micro-epsilon.com
919 787 9707
919 787 9706