More precision.
 

Geometry inspection system for silicon ingots

ingot-geometry-inspection--570px--en.jpg (21 KB))

Details

Ingot lengths up to 2500 mm
Virtual reconstruction of the surface
Can be fitted with integrated load cell
Automatic or manual marking of the defective places
Increase of the ingot yield
back to product group "Semiconductor inspection"
Contact

Micro-Epsilon Headquarters

Phone +49 8542 / 168 - 0
Fax +49 8542 / 168 - 90
eMail Send email
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