Geometry inspection system for silicon ingots

Details

• Ingot lengths up to 2500 mm
•  Virtual reconstruction of the surface
•  Can be fitted with integrated load cell
•  Automatic or manual marking of the defective places
•  Increase of the ingot yield
back to product group "Semiconductor measurement"
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Phone 919 787 9707
Fax 919 787 9706
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HEADQUARTER MICRO-EPSILON AMERICA
8120 Brownleigh Dr. Raleigh, NC 27617
me-usa@micro-epsilon.com mobile phone icon
919 787 9707 phone icon
919 787 9706 fax icon