Select country / language
 
 

Sensors
Inspection systems
Applications

Glossary - technical measuring terms simply defined

A

Absolute displacement transducer Absorption Accuracy Actuator Adjustment Ambient light, permissible Analogue output Application ASIC ATEX

B

Bandwidth Base distance Baud rate

C

Cable, halogen-free Calendering Calibration CANopen Capacitive measurement principle capaNCDT CE directive CENELEC Characteristic CMU-module Confocal chromatic Crosstalk

D

Data sheet, technical Data transfer rate DCAM Device Net Digital output Displacement sensors Distance Sensor DKD Draw-wire sensor

E

Eddy current eddyNCDT Electromagnetic compatibility (EMC) Emissivity Emitter Encoder Encoder, absolute Encoder, incremental

F

Ferro Ferro, not Firmware Focus FOV FPA Frequency response Frequency spectrum Full duplex

G

Grey body source Guard electrode Guard electrode width

H

Half duplex High pressure resistant High temperature sensor / high temperature resistant HTL Hysteresis

I

ICONNECT IFOV induSENSOR Interference emission Interference immunity

J

Laser protection class Laser sensors Laser triangulation Light spot diameter Linearity Long-term stability Lumen, unit Lux, unit LVDS LVDT, Linear Variable Differential Transformer

K

Magnetic fields with inductive sensors Master / slave Measurement device Measurement object Measurement object diameter Measurement range Measuring frequency Measuring rate

L

NETD Noise Noise, thermal Non-linearity

M

Offset Operating temperature Optical fibre Optical sensors optoCONTROL optoNCDT OSI layer model

N

Poalarity reversal protection Polling Position sensors Potentiometer Process-capatibility-index Process-capatibility-index, smallest Profibus DP (PB) Protection

O

Quantification error

P

Radiation Radiation, specific Radiation, spectral specific Ranging sensor Real-time Receiver Reference temperature Referenzauflösung Reflection Reflection, diffuse Reflection, direct Reflection, optical Repeatability Resolution Response time Rise time RS232 interface RS422 RS485 RTSC

Q

Sampling rate Sampling theorem Samplingrate scanCONTROL SDK Sensitivity Sensor Sensor measuring area, active Shock Short-circuit rating Signal-to-noise ratio Simplex SMD Spectral range Spring constant SSI Start and end of measuring range, midrange Storage temperature Strain Gauge Synchronisation

R

Target Telemetry Temperature range Temperature range, infra-red Temperature stability Tensile strength thermoMETER Tilting Time-of-flight-principle Transmissivity Triggering TTL

S

Vibration

T

wireSENSOR

U

X axis

V

Y axis

W

Z axis
Downloads
Newsletter
Subscribe now to our measurement newsletter
Trade shows

Next exhibition:

Show all exhibitions
Contact

ME USA Headquarter

Phone 919 787 9707
Fax 919 787 9706
eMail Send email
me-usa@micro-epsilon.com
Find contact person
 
US America [EN] ENInternational [EN] DEDeutschland [DE] FRFrance [FR] ENUnited Kingdom [EN] DESchweiz [DE] CZČeská republika [CZ] SKSlovenská republika [SK] RUРоссия [RU] CNChina [CN]
bookmark this page:
Mister Wong del.icio.us Google Yahoo! MyWeb reddit MySpace Facebook twitter
Privacy & legal information About Sitemap
HEADQUARTER MICRO-EPSILON AMERICA
8120 Brownleigh Dr. Raleigh, NC 27617
me-usa@micro-epsilon.com mobile phone icon
919 787 9707 phone icon
919 787 9706 fax icon