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Sensors
Inspection systems
Applications

Glossary - technical measuring terms simply defined

Absolute displacement transducer Absorption Accuracy Actuator Adjustment Ambient light, permissible Analogue output Application ASIC ATEX
Bandwidth Base distance Baud rate
Cable, halogen-free Calendering Calibration CANopen Capacitive measurement principle capaNCDT CE directive CENELEC Characteristic CMU-module Confocal chromatic Crosstalk
Data sheet, technical Data transfer rate DCAM Device Net Digital output Displacement sensors Distance Sensor DKD Draw-wire sensor
Eddy current eddyNCDT Electromagnetic compatibility (EMC) Emissivity Emitter Encoder Encoder, absolute Encoder, incremental EtherCAT Ethernet
Ferro Ferro, not Firmware Focus FOV FPA Frequency response Frequency spectrum Full duplex
Grey body source Guard electrode Guard electrode width
Half duplex High pressure resistant High temperature sensor / high temperature resistant HTL Hysteresis
ICONNECT IFOV induSENSOR Interference emission Interference immunity
Laser protection class Laser sensors Laser triangulation Light spot diameter Linearity Long-term stability Lumen, unit Lux, unit LVDS LVDT, Linear Variable Differential Transformer
Magnetic fields with inductive sensors Master / slave Measurement device Measurement object Measurement object diameter Measurement range Measuring frequency Measuring rate
NETD Noise Noise, thermal Non-linearity
Offset Operating temperature Optical fibre Optical sensors optoCONTROL optoNCDT OSI layer model
Poalarity reversal protection Polling Position sensors Potentiometer Process-capatibility-index Process-capatibility-index, smallest Profibus DP (PB) Protection
Quantification error
Radiation Radiation, specific Radiation, spectral specific Ranging sensor Real-time Receiver Reference temperature Referenzauflösung Reflection Reflection, diffuse Reflection, direct Reflection, optical Refraction index Repeatability Reproducibility via temperature Resolution Response time Rise time RS232 interface RS422 RS485 RTSC
Sampling rate Sampling theorem Samplingrate scanCONTROL SDK Sensitivity Sensor Sensor measuring area, active Shock Short-circuit rating Signal-to-noise ratio Simplex SMD Spectral range Spectral technology Spring constant SSI Start and end of measuring range, midrange Storage temperature Strain Gauge Synchronisation
Target Telemetry Temperature range Temperature range, infra-red Temperature stability Tensile strength thermoMETER Tilting Time-of-flight-principle Transmissivity Triggering TTL
Vibration
wireSENSOR
X axis
Y axis
Z axis
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919 787 9706
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HEADQUARTER MICRO-EPSILON AMERICA
8120 Brownleigh Dr. Raleigh, NC 27617
me-usa@micro-epsilon.com mobile phone icon
919 787 9707 phone icon
919 787 9706 fax icon