Controller with external Xenon light source for measuring rates up to 70kHz
The confocal chromatic confocalDT 2471 controllers are equipped with an external Xenon light source and achieve measuring rates up to 70kHz. The IFC2471 controllers are used for fast distance and thickness measurements and can be operated with any IFS sensor. Furthermore, the IFC2471MP controller provides up to 6 peaks which allows the thickness of transparent, multi-layer objects to be measured.
Set up and configuration of controller and sensors is handled in a user-friendly web interface. Data output is via Ethernet, EtherCAT, RS422 or analog output.
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